标准号：IEC 62951-8:2023
发布日期：2023-01-19
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
半导体器件 - 柔性可拉伸半导体器件 - 第8部分：柔性阻变存储器拉伸性、柔性和稳定性测试方法
